DocumentCode :
1237822
Title :
Optimization and passivation of HTS step-edge Josephson junction rf SQUIDs
Author :
Du, Jia
Author_Institution :
Telecommun. & Ind. Phys., CSIRO, Lindfield, NSW, Australia
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
865
Lastpage :
868
Abstract :
In this work, various methods of improving the performance and yield of our step-edge junction rf SQUIDs are described. These methods include adjusting the YBCO thin film thickness and trimming of the device parameters by ion beam etching and heat annealing. Significant improvement in SQUID performance and yield was demonstrated by employing these techniques. The effects of passivation of the rf SQUIDs by ex-situ deposition of an amorphous-YBCO thin film were also studied. No adverse effects were observed for the noise performance of the devices due to passivation and long-term stability was obtained.
Keywords :
Josephson effect; SQUIDs; annealing; barium compounds; high-temperature superconductors; passivation; sputter etching; superconducting device noise; superconducting thin films; yttrium compounds; HTS step-edge Josephson junction RF SQUID; YBCO thin film; YBaCuO; annealing; ion beam etching; noise spectrum; passivation; Annealing; Etching; High temperature superconductors; Ion beams; Josephson junctions; Passivation; SQUIDs; Sputtering; Thin film devices; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.814069
Filename :
1211741
Link To Document :
بازگشت