Abstract :
The theme of the 2005 International Test Conference is “Test: Survival of the Fittest.” In conjunction with this year´s ITC, this special section examines how test helps the fittest of the industry´s chips, boards, and systems survive manufacturing to reach its customers. These articles discuss topics such as X-tolerant test response compaction, reducing yield loss using a constrained ATPG, and using IDDQ testing with today´s high background currents.
