Influence of charging energy on Cooper pair tunneling in Bi-2212 small intrinsic Josephson junctions

Author

Kawae, T. ; Yasuda, T. ; Kim, S.-J. ; Nakajima, K. ; Yamashita, T.

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

897

Lastpage

900

Abstract

We have investigated the properties of submicron intrinsic Josephson junctions (IJJs) fabricated on Bi₂Sr₂CaCu₂O_8+δ liquid phase epitaxy film. The IJJs with junction area S<2 μm² showed individual current-voltage curves, which have suppressed 1st branch and unsuppressed other branches. This suppression was observed systematically as an increase the ratio of charging energy and Josephson coupling energy. It is expected that such suppressions are due to charging effect in IJJs.

Keywords

Cooper pairs; Josephson effect; bismuth compounds; calcium compounds; high-temperature superconductors; liquid phase epitaxial growth; strontium compounds; superconducting epitaxial layers; superconductive tunnelling; Bi-2212 small intrinsic Josephson junctions; Bi₂Sr₂CaCu₂O_8+δ; Cooper pair tunneling; Josephson coupling energy; charging energy; high temperature superconductor; individual current-voltage curves; liquid phase epitaxy film; Bismuth; Epitaxial growth; Etching; Fabrication; High temperature superconductors; Josephson junctions; Strontium; Substrates; Superconducting films; Tunneling;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.814074

Filename

1211749