DocumentCode :
1237911
Title :
Numerical analysis of arbitrarily shaped discontinuities between planar dielectric waveguides with different thicknesses
Author :
Hirayama, Katsutoshi ; Koshiba, Masanori
Author_Institution :
Dept. of Electron. Eng., Kushiro Nat. Coll. of Technol., Japan
Volume :
38
Issue :
3
fYear :
1990
fDate :
3/1/1990 12:00:00 AM
Firstpage :
260
Lastpage :
264
Abstract :
An approach that combines the finite-element and boundary-element methods is applied to the analysis of arbitrarily shaped discontinuities between planar dielectric waveguides with different thicknesses. The fields interior and exterior to the region enclosing the discontinuities are treated by the finite-element method and the boundary-element method, respectively. The waveguide regions connected to the discontinuities are handled by analytical solutions. In this approach, scattering characteristics of the discontinuities can be accurately evaluated, and far-field radiation patterns can be easily calculated. To show the validity and usefulness of this approach, the scattering characteristics of a step, a staircase transformer, and a tapered transformer are analyzed. Also, a simple equivalent network approach is introduced for estimating the reflection and transmission characteristics of planar dielectric waveguide discontinuities, and the effectiveness of this simple approach is confirmed by comparing the numerical results with those of the approach that combines the finite-element and boundary-element methods
Keywords :
boundary-elements methods; dielectric waveguides; electromagnetic wave scattering; equivalent circuits; finite element analysis; waveguide theory; BEM; FEA; FEM; arbitrarily shaped discontinuities; boundary-element methods; equivalent network; exterior fields; far-field radiation patterns; finite-element method; interior fields; numerical analysis; planar dielectric waveguides; reflection characteristics; scattering characteristics; staircase transformer; step transformer; tapered transformer; transmission characteristics; waveguide thickness; Dielectrics; Finite element methods; Numerical analysis; Optical planar waveguides; Optical scattering; Optical waveguide theory; Optical waveguides; Planar waveguides; Reflection; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.45342
Filename :
45342
Link To Document :
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