DocumentCode
1237949
Title
ITC is Cool
Author
Aitken, Robert C.
Author_Institution
ARM
Volume
22
Issue
6
fYear
2005
Firstpage
616
Lastpage
616
Abstract
ITC is cool. How can this be, you ask? This is the International Test Conference´s 36th year, which makes it a middle-aged conference; and, as anyone who has ever been middle-aged knows, being cool at this time of life is a serious challenge. ITC doesn´t try to be cool, at least not in the way that, say, Macworld does. ITC tries instead to be interesting, innovative, and informative. All three of these qualities are vital for a successful conference.
Keywords
ITC; International Test Conference; board and system test; high-frequency test; silicon debug; test compression; Circuit faults; Hair; Humans; Internet; Life testing; Marketing and sales; Materials testing; Silicon; Technological innovation; Wheels; ITC; International Test Conference; board and system test; high-frequency test; silicon debug; test compression;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2005.146
Filename
1541931
Link To Document