DocumentCode :
1237949
Title :
ITC is Cool
Author :
Aitken, Robert C.
Author_Institution :
ARM
Volume :
22
Issue :
6
fYear :
2005
Firstpage :
616
Lastpage :
616
Abstract :
ITC is cool. How can this be, you ask? This is the International Test Conference´s 36th year, which makes it a middle-aged conference; and, as anyone who has ever been middle-aged knows, being cool at this time of life is a serious challenge. ITC doesn´t try to be cool, at least not in the way that, say, Macworld does. ITC tries instead to be interesting, innovative, and informative. All three of these qualities are vital for a successful conference.
Keywords :
ITC; International Test Conference; board and system test; high-frequency test; silicon debug; test compression; Circuit faults; Hair; Humans; Internet; Life testing; Marketing and sales; Materials testing; Silicon; Technological innovation; Wheels; ITC; International Test Conference; board and system test; high-frequency test; silicon debug; test compression;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2005.146
Filename :
1541931
Link To Document :
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