• DocumentCode
    1238196
  • Title

    Refractive index and material dispersion interpolation of doped silica in the 0.6-1.8 mu m wavelength region

  • Author

    Sunak, Harish R D ; Bastien, Steven P.

  • Author_Institution
    Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
  • Volume
    1
  • Issue
    6
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    142
  • Lastpage
    145
  • Abstract
    An extension of the Claussius-Mossotti interpolation scheme is proposed so that the refractive index and material dispersion of GeO/sub 2/- and F-doped silica glasses (with doping concentrations different than those of published data) can be predicted in the 0.6-1.8- mu m wavelength region. The new interpolation expression provides a well-behaved functional relationship for use in computer models which analyse propagation in single-mode fibers. The technique proposed is particularly powerful because it can be applied to any glass, whether single or multicomponent, having any other single dopant.<>
  • Keywords
    fluorine; germanate glasses; optical dispersion; optical glass; refractive index; silicon compounds; 0.6 to 1.8 micron; Claussius-Mossotti interpolation scheme; SiO/sub 2/:F; SiO/sub 2/:GeO/sub 2/; doping concentrations; material dispersion interpolation; multicomponent glass; optical glass; propagation; refractive index; single glass; single-mode fibers; well-behaved functional relationship; Composite materials; Doping; Glass; History; Interpolation; Optical fiber communication; Oscillators; Refractive index; Semiconductor process modeling; Silicon compounds;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.36016
  • Filename
    36016