DocumentCode :
1238196
Title :
Refractive index and material dispersion interpolation of doped silica in the 0.6-1.8 mu m wavelength region
Author :
Sunak, Harish R D ; Bastien, Steven P.
Author_Institution :
Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
Volume :
1
Issue :
6
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
142
Lastpage :
145
Abstract :
An extension of the Claussius-Mossotti interpolation scheme is proposed so that the refractive index and material dispersion of GeO/sub 2/- and F-doped silica glasses (with doping concentrations different than those of published data) can be predicted in the 0.6-1.8- mu m wavelength region. The new interpolation expression provides a well-behaved functional relationship for use in computer models which analyse propagation in single-mode fibers. The technique proposed is particularly powerful because it can be applied to any glass, whether single or multicomponent, having any other single dopant.<>
Keywords :
fluorine; germanate glasses; optical dispersion; optical glass; refractive index; silicon compounds; 0.6 to 1.8 micron; Claussius-Mossotti interpolation scheme; SiO/sub 2/:F; SiO/sub 2/:GeO/sub 2/; doping concentrations; material dispersion interpolation; multicomponent glass; optical glass; propagation; refractive index; single glass; single-mode fibers; well-behaved functional relationship; Composite materials; Doping; Glass; History; Interpolation; Optical fiber communication; Oscillators; Refractive index; Semiconductor process modeling; Silicon compounds;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.36016
Filename :
36016
Link To Document :
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