• DocumentCode
    1238242
  • Title

    Improved Characterization Methology for MOSFETs up to 220 GHz

  • Author

    Waldhoff, Nicolas ; Andrei, Cristian ; Gloria, Daniel ; Lepilliet, Sylvie ; Danneville, François ; Dambrine, Gilles

  • Author_Institution
    Inst. d´´Electron., de Microelectron. et de Nanotechnol. (IEMN), Villeneuve-d´´Ascq
  • Volume
    57
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1237
  • Lastpage
    1243
  • Abstract
    Measurement and modeling procedures to accurately extract a small-signal equivalent circuit of advanced MOSFETs up to 220 GHz are proposed. The methodology carried out goes from the vector network analyzer calibration to the simulation results using complex deembedding. Good comparisons between the measurement and the simulation data obtained using this procedure are shown up to 220 GHz.
  • Keywords
    MOSFET; calibration; integrated circuit design; integrated circuit modelling; MOSFET; frequency 220 GHz; small-signal equivalent circuit; vector network analyzer calibration; $S$ -parameters; Calibration; MOSFET; circuit modeling; deembedding; millimeter-wave measurement; small-signal model;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2009.2017359
  • Filename
    4814658
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1238242