Title :
Improved Characterization Methology for MOSFETs up to 220 GHz
Author :
Waldhoff, Nicolas ; Andrei, Cristian ; Gloria, Daniel ; Lepilliet, Sylvie ; Danneville, François ; Dambrine, Gilles
Author_Institution :
Inst. d´´Electron., de Microelectron. et de Nanotechnol. (IEMN), Villeneuve-d´´Ascq
fDate :
5/1/2009 12:00:00 AM
Abstract :
Measurement and modeling procedures to accurately extract a small-signal equivalent circuit of advanced MOSFETs up to 220 GHz are proposed. The methodology carried out goes from the vector network analyzer calibration to the simulation results using complex deembedding. Good comparisons between the measurement and the simulation data obtained using this procedure are shown up to 220 GHz.
Keywords :
MOSFET; calibration; integrated circuit design; integrated circuit modelling; MOSFET; frequency 220 GHz; small-signal equivalent circuit; vector network analyzer calibration; $S$ -parameters; Calibration; MOSFET; circuit modeling; deembedding; millimeter-wave measurement; small-signal model;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2009.2017359
