DocumentCode :
1238674
Title :
2005 Reviewers List
Volume :
28
Issue :
1
fYear :
2006
Firstpage :
169
Lastpage :
174
Abstract :
The publication offers a note of thanks and lists its reviewers.
Keywords :
IEEE;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2006.1
Filename :
1542043
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1238674