DocumentCode :
123884
Title :
A Field Programmable Gate Array-Based Digital Temperature Sensor with Improved Immunity to Static Supply Shift
Author :
Princewill, Akpojotor ; Ayodeji, Oluwatope ; Kayode, Ayodele ; Adesola, Aderounmu ; Rotimi, Adagunodo
Author_Institution :
Dept. of Comput. Sci. & Eng., Obafemi Awolowo Univ., Ile-Ife, Nigeria
fYear :
2014
fDate :
27-29 Aug. 2014
Firstpage :
1
Lastpage :
8
Abstract :
A digital temperature sensor is an integrated system that can sense and convert heat measurement from an analog domain to its digital equivalent. However, digital temperature sensing suffers inaccuracy as a result of shift in supply voltage. In this paper, a digital temperature sensor with an improved noise resistant technique for the reliability of digital systems is presented. The proposed method uses a dual delay-line instead of the typical approach that employs conversion and calibration technique to mitigate the effect of noise. The digital temperature sensor is realized using Very High-Speed Integrated Circuit Hardware Description Language and synthesized in Quartus II. The result is a resource efficient digital temperature sensor with a measurement error of - 1.297°C ~ 1.799°C over a temperature range of 40°C ~ 120°C. A temperature sensor resistant to static supply shift of 1.8 ~ 1.5 supply voltage range, suitable for quick deployment within a Field Programmable Gate Array is achieved.
Keywords :
calibration; computerised instrumentation; delay lines; digital instrumentation; field programmable gate arrays; hardware description languages; interference suppression; measurement errors; power supply circuits; reliability; temperature sensors; FPGA-based digital temperature sensor; Quartus II; calibration technique; conversion technique; digital systems reliability; dual delay line; field programmable gate array; improved immunity; improved noise resistant technique; integrated system; measurement error; noise effect mitigation; static supply shift; very high speed integrated circuit hardware description language; Calibration; Delay lines; Delays; Logic gates; Temperature measurement; Temperature sensors; Digital Temperature Sensor; Dual Delay- Line; Field Programmable Gate Array; Noise Resistant; Static Supply Shift;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location :
Verona
Type :
conf
DOI :
10.1109/DSD.2014.81
Filename :
6927219
Link To Document :
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