Post-Process Removal of Spurious Fabry-PÉrot Oscillations Caused by Cleaved Waveguide-Ends

Author

Gnan, Marco ; Bellanca, Gaetano ; De La Rue, Richard M.

Author_Institution

Dept. of Eng., Univ. of Ferrara, Ferrara

Volume

27

Issue

5

fYear

2009

fDate

3/1/2009 12:00:00 AM

Firstpage

500

Lastpage

510

Abstract

Testing of integrated (guided-wave) optical component that uses cleaved facets for input/output coupling has to deal with spurious Fabry-Perot cavity effects that can interfere heavily with observation and measurement of the behavior of the device. This paper demonstrates a technique that takes advantage of such interference for the reconstruction of the complete characteristics of a generic component. By studying a theoretical model of the system, a post-process computational tool is developed and verified through numerical testing. Starting from a single transmittance data set, the amplitude and phase of the transmission and reflection coefficients are reconstructed with considerable accuracy. Initial experimental testing demonstrates consistency in reconstructing the behavior of a real device.

Keywords

Fabry-Perot resonators; integrated optics; optical waveguides; cleaved waveguide-ends; integrated optical component; optical waveguide component; post-process removal; reflection coefficients; spurious Fabry-Perot oscillations; transmission coefficients; Interference; Optical coupling; Optical devices; Optical resonators; Optical scattering; Optical waveguide components; Optical waveguide theory; Optical waveguides; Silicon on insulator technology; Ultrafast optics; Fabry–PÉrot resonators; optical waveguide components; scattering matrices; silicon on insulator technology;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2008.2004593

Filename

4814751