Photo-Stability Measurement of Electro-Optic Polymer Waveguides With High Intensity at 1550-nm Wavelength

Author

Takahashi, Satsuki ; Bhola, Bipin ; Yick, Andrew ; Steier, William H. ; Luo, Jingdong ; Jen, Alex K Y ; Jin, Dan ; Dinu, Raluca

Author_Institution

Univ. of Southern California, Los Angeles, CA

Volume

27

Issue

8

fYear

2009

fDate

4/15/2009 12:00:00 AM

Firstpage

1045

Lastpage

1050

Abstract

Photo-stability measurements of electro-optic polymer inverted ridge waveguides, fabricated from AJ-CKL1, AJ416 and LPD-80, are conducted up to 30, 100, and 100 mW of input power coupled into the waveguides respectively. These experiments are performed in a N₂ atmosphere to exclude absorbed O₂. AJ416 and LPD-80 are found to be stable up to at least 1 MW/cm² at 1550 nm. In contrast, photo-degradation was observed in an ambient atmosphere with 1 mW (LPD-80) and 10 mW (AJ-CKL1) coupled into the waveguides.

Keywords

electro-optical devices; optical fabrication; optical polymers; optical testing; optical waveguides; ridge waveguides; AJ-CKL1; AJ416; LPD-80; electro-optic polymer waveguide; inverted ridge waveguide; photo-degradation; photo-stability measurement; power 1 mW; power 10 mW; wavelength 1550 nm; Atmosphere; Atmospheric measurements; Electrooptic devices; Electrooptical waveguides; Optical polymers; Optical waveguides; Power measurement; Stability; Temperature sensors; Wavelength measurement; Optical polymers; optical waveguides; photo-degradation; photo-stability;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2008.2011500

Filename

4814757