• DocumentCode
    1239354
  • Title

    Small Bend Structures Using Trenches Filled With Low-Refractive Index Material for Miniaturizing Silica Planar Lightwave Circuits

  • Author

    Ito, Jiro ; Tsuda, Hiroyuki

  • Author_Institution
    Dept. of Electron. Eng., Keio Univ., Yokohama
  • Volume
    27
  • Issue
    6
  • fYear
    2009
  • fDate
    3/15/2009 12:00:00 AM
  • Firstpage
    786
  • Lastpage
    790
  • Abstract
    We have proposed the fabrication of small bend structures using trenches along both sides of the core, filled with low-refractive index material, in order to miniaturise silica planar lightwave circuits. The minimum bending radius of a silica waveguide was reduced from 2 mm to 200 mum by filling the trenches with low-refractive index material. The local lateral relative refractive index difference (Delta) was increased to 8.64%. We fabricated cascade S-shaped waveguides to estimate a bend loss of the proposed structure. Moreover, we applied those structures to arrayed-waveguide gratings (AWG)s. Both 8-channel, 100-GHz channel-spacing and 8-channel, 12.5-GHz channel-spacing AWGs were successfully fabricated. Compared with conventional AWGs, sizes of these devices were reduced by factors of about 2 and 4, respectively.
  • Keywords
    arrayed waveguide gratings; bending; optical losses; optical planar waveguides; refractive index; silicon compounds; AWG; SiO2; arrayed-waveguide gratings; bend loss; bending radius; cascade S-shaped waveguides; channel-spacing; frequency 100 GHz; frequency 12.5 GHz; local lateral relative refractive index difference; low-refractive index material; silica planar lightwave circuits; silica waveguide; Arrayed waveguide gratings; Circuits; High speed optical techniques; Optical losses; Optical refraction; Optical variables control; Optical waveguides; Programmable control; Silicon compounds; Waveguide junctions; Integrated optics; optical planar waveguide; waveguide bends;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.923943
  • Filename
    4814811