Title :
Design of Fault-Secure Transposed FIR Filters Protected Using Residue Codes
Author :
Piestrak, Stanislaw J. ; Patronik, Piotr
Author_Institution :
Inst. Jean Lamour, Univ. de Lorraine, Nancy, France
Abstract :
Several approaches to design of fault-secure or/and fault-tolerant digital finite input response (FIR) filters with varying fault coverage and hardware efficiency have been proposed. However, no specific implementations in modern nanometric technologies using error detecting codes like residue codes or parity codes has been reported yet. In this paper, we will study design of fault-secure multipliers-accumulators (MACs) and digital FIR filters protected using residue codes. Several versions of the fault-secure transpose digital FIR filters were synthesized using RC Compiler v.8.1 for the 65 nm technology. The results obtained leave no doubts that residue codes could be extremely efficient, because hardware overhead for the transpose digital FIR filters with 16-bit operands, protected using residue code mode 3, is below 2%, which is significantly less than by using any other technique reported to date. To note that, unlike claimed in some recent works, should some elementary design rules be applied, the circuits proposed can guarantee the 100% error coverage.
Keywords :
FIR filters; error detection codes; fault tolerance; residue codes; RC Compiler v.8.1; error detecting codes; fault coverage; fault tolerant digital finite input response filters; fault-secure transposed FIR filters; hardware efficiency; multipliers-accumulators; parity codes; residue codes; size 65 nm; Adders; Circuit faults; Fault tolerance; Finite impulse response filters; Generators; Hardware; Integrated circuit modeling; concurrent error detection; digital finite input response (FIR) filters; fault-secure circuits; residue codes;
Conference_Titel :
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location :
Verona
DOI :
10.1109/DSD.2014.110