Title :
High-efficiency AlGaInP thin-film LEDs using surface-texturing and waferbonding with conductive epoxy
Author :
Rooman, C. ; Kuijk, M. ; De Jonge, S. ; Heremans, P.
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
In thin-film light-emitting diodes (LEDs) absorption of the generated light in the substrate is avoided by the transfer of the epitaxial LED layers on a reflecting carrier. The extraction efficiency can be further enhanced by texturing the top surface. We developed a structure for high-efficiency surface-textured thin-film AlGaInP LEDs with improved heat dissipation by waferbonding onto a carrier substrate using conductive epoxy. The improved heat removal toward the substrate through the conductive epoxy increases the maximum allowable current density by more than a factor of two, compared to LEDs bonded on the carrier substrate with benzocyclobutene. As a result, an optical power of 65 mW is achieved for unencapsulated devices emitting at 650 nm. Using this technology, we also demonstrate an external quantum efficiency of 43% for unencapsulated LEDs at a peak wavelength of 650 nm, which is the highest reported efficiency for AlGaInP thin-film LEDs. The external quantum efficiency increases to 52% at 100 K.
Keywords :
III-V semiconductors; aluminium compounds; cooling; gallium compounds; light emitting diodes; light reflection; semiconductor epitaxial layers; surface texture; thin film devices; wafer bonding; 100 K; 65 mW; 650 nm; AlGaInP; AlGaInP LED; benzocyclobutene; carrier substrate; conductive epoxy; epitaxial LED layers; external quantum efficiency; extraction efficiency; light absorption; reflecting carrier; surface texturing; surface-textured thin film; thin film LED; unencapsulated LED; waferbonding; Absorption; Conductive films; Current density; Light emitting diodes; Optical devices; Optical surface waves; Stimulated emission; Substrates; Surface texture; Wafer bonding; AlGaInP; conductive epoxy; high-efficiency; light-emitting diodes (LEDs); surface-texturing; thin-film devices;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.859150