Title :
Profilometry using optical microwaves with different carrier frequencies and two-photon absorption process of photodetector
Author :
Tanaka, Yosuke ; Sako, Naoya ; Imoto, Soichiro ; Kurokawa, Takashi
Author_Institution :
Graduate Sch. of Eng., Tokyo Univ. of Agric. & Technol., Japan
Abstract :
We demonstrate and evaluate a novel profilometry based on a pair of optical microwaves with different wavelengths and two-photon absorption process in a photodetector. The operation principle is confirmed by using a fiber-optic system with a path length difference of 0.1, 1, 10, and 100 m. The accuracy was measured to be better than 10-4, which is comparable to the previously demonstrated system using orthogonally polarized optical microwave.
Keywords :
microwave photonics; optical fibres; photodetectors; surface topography measurement; two-photon processes; carrier frequencies; fiber-optic system; optical microwaves; photodetector; profilometry; two-photon absorption; Electromagnetic wave absorption; Frequency; Optical fiber polarization; Optical interferometry; Optical modulation; Optical noise; Optical polarization; Optical refraction; Optical variables control; Photodetectors; Optical variables measurement; profilometry; two-photon absorption;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.859120
