Title :
FEM analysis of current limiting characteristics of a superconducting thin film current limiting device by the current vector potential method
Author :
Sugita, Shinya ; Ohsaki, Hiroyuki
Author_Institution :
Dept. of Electr. Eng., Univ. of Tokyo, Japan
fDate :
6/1/2003 12:00:00 AM
Abstract :
Numerical analysis of a resistive superconducting fault current limiter (SFCL) using superconducting thin film has been performed. The finite element method (FEM) based on the current vector potential with the thin plate approximation was used to study current limiting characteristics and current imbalance phenomenon of a single SFCL device. Transport current and temperature dependence were also taken into account by solving a three-dimensional coupled problem of electromagnetic field, an electric circuit and thermal field. An E-J relation based on the power law was adopted for modeling the electromagnetic property of superconductor. This analysis method enables us to calculate not only current limiting characteristics but also current density, flux density, and heat generation at any point in the superconducting thin film at any time.
Keywords :
current distribution; fault current limiters; finite element analysis; high-temperature superconductors; superconducting devices; superconducting thin films; FEM analysis; current density; current imbalance phenomenon; current limiting characteristics; current vector potential method; electric circuit; finite element method; flux density; heat generation; numerical analysis; resistive fault current limiter; superconducting thin film current limiting device; temperature dependence; thermal field; thin plate approximation; Coupling circuits; Current limiters; Electromagnetic coupling; Electromagnetic fields; Electromagnetic modeling; Fault current limiters; Finite element methods; Numerical analysis; Superconducting thin films; Temperature dependence;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.812972