Title :
Current limiting characteristics of flux-lock type high-TC superconducting fault current limiter with control circuit for magnetic field
Author :
Lim, Sung-Hun ; Kang, Hyeong-Gon ; Choi, Hyo-Sang ; Lee, Seong-Ryong ; Han, Byoung-Sung
Author_Institution :
Sch. of Electron. & Inf. Eng., Chonbuk Nat. Univ., South Korea
fDate :
6/1/2003 12:00:00 AM
Abstract :
A flux-lock type superconducting fault current limiter (SFCL) can change the amplitude of the magnetic field by adjusting either the inserting resistance or the phase adjusting capacitor. However, the magnetic field coil cannot generate enough magnetic field for some time after a fault happens due to resonance between the phase adjusting capacitor and the magnetic field coil. It is also required for the magnetic field generated to be controlled for the application to high-TC superconducting (HTSC) elements which have different critical characteristics. This paper proposes a flux-lock type SFCL with a control circuit for the magnetic field, which is composed of solid state switches connected with the magnetic field coil. A current limiting experiment of this model was carried out. We showed that the amplitude of the fault current as well as the magnetic field could be controlled by the sinusoidal pulse width modulation (SPWM) operation, one of the switching techniques for controlling the magnetic field.
Keywords :
critical current density (superconductivity); fault current limiters; high-temperature superconductors; pulse width modulation; superconducting device testing; SFCL; control circuit; critical characteristics; current limiting characteristics; current limiting experiment; flux-lock type fault current limiter; high-TC superconducting device; inserting resistance; phase adjusting capacitor; sinusoidal pulse width modulation; solid state switches; Capacitors; Character generation; Circuit faults; Current limiters; Fault current limiters; Magnetic fields; Magnetic resonance; Magnetic switching; Pulse width modulation; Superconducting coils;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.812984