DocumentCode :
1240039
Title :
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation
Author :
Momenzadeh, Mariam ; Huang, Jing ; Tahoori, Mehdi B. ; Lombardi, Fabrizio
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
24
Issue :
12
fYear :
2005
Firstpage :
1881
Lastpage :
1893
Abstract :
Quantum-dot cellular automata (QCA) offers a new computing paradigm for nanotechnology. The basic logic elements of this technology are the majority voter (MV) and the inverter (INV). However, an experimental evaluation has shown that MV is not efficiently used during technology mapping by existing logic-synthesis tools. In this paper, we propose the design and characterization of a novel complex, yet very small, QCA logic gate: the and-or-inverter (AOI) gate. The paper presents a detailed simulation-based analysis of the AOI gate, as well as the study of QCA defects and their effects at the logic level. The AOI implements a universal logic gate; all elementary gates can be implemented by the AOI gate. Moreover, many two-level logic functions can be directly implemented by a single AOI gate. The AOI gate performs quite favorably, in terms of digital logic synthesis. Unlike MV, this gate is efficiently used by existing logic-synthesis tools. Our experimental data on synthesis of complex designs show that using the AOI gate instead of MV, results in up to 23.9% logic area savings, while improving the overall delay.
Keywords :
cellular automata; circuit testing; failure analysis; logic circuits; logic design; nanoelectronics; semiconductor quantum dots; QCA logic gate; and-or-inverter gate; defect analysis; digital logic synthesis; gate design; logic synthesis tools; nanotechnology; quantum dot cellular automata; technology mapping; two level logic functions; universal logic gate; Analytical models; Logic design; Logic functions; Logic gates; Logic testing; Nanotechnology; Pulse inverters; Quantum cellular automata; Quantum computing; Quantum dots; AOI; QCA; defect analysis; device characterization; emerging technologies; testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.852667
Filename :
1542242
Link To Document :
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