Title : 
Multi-directional error correction schemes for SRAM-based FPGAs
         
        
            Author : 
Venkataraman, S. ; Santos, Ricardo ; Maheshwari, Shishir ; Kumar, Ajit
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
         
        
        
        
        
        
            Abstract : 
Readback scrubbing is considered as an effective mechanism to correct errors in Static-RAM (SRAM)-based Field Programmable Gate Arrays (FPGAs). However, current solutions have a low error correction percentage per unit area overhead. This paper proposes two new error detection/correction mechanisms that combine frame readback scrubbing with error correction codes (ECCs) that are applied in multiple directions, to achieve a high error correction percentage per unit area overhead. Experiments conducted show that the proposed schemes have an excellent error correction percentage (over 99%), especially for multi-bit upsets, while using up to 59.37% lesser area overhead compared with other state-of-the-art.
         
        
            Keywords : 
SRAM chips; error correction codes; field programmable gate arrays; ECC; SRAM-based FPGA; error correction codes; error detection-correction; field programmable gate arrays; frame readback scrubbing; multidirectional error correction; static-RAM; Circuit faults; Computer architecture; Equations; Error correction; Error correction codes; Field programmable gate arrays; Hardware;
         
        
        
        
            Conference_Titel : 
Field Programmable Logic and Applications (FPL), 2014 24th International Conference on
         
        
            Conference_Location : 
Munich
         
        
        
            DOI : 
10.1109/FPL.2014.6927448