Title :
Variable temperature scanning laser microscopy of wider width high temperature superconducting films
Author :
Wang, L.B. ; Price, M.B. ; Kwon, C. ; Jia, Q.X.
Author_Institution :
Dept. of Phys. & Astron., California State Univ., Long Beach, CA, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.
Keywords :
high-temperature superconductors; measurement by laser beam; optical microscopy; superconducting epitaxial layers; superconducting tapes; superconducting transition temperature; 10 mm; 2 mm; 300 micron; bolometric response; epitaxial superconducting films; resistive properties; spatial distribution; spatial nonuniformity; superconducting transition temperature; variable temperature scanning laser microscopy; wider width high temperature superconducting films; Critical current density; High temperature superconductors; Laser beams; Laser transitions; Scanning electron microscopy; Superconducting films; Superconducting transition temperature; Temperature control; Temperature distribution; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.811908
