Variable temperature scanning laser microscopy of wider width high temperature superconducting films

Author

Wang, L.B. ; Price, M.B. ; Kwon, C. ; Jia, Q.X.

Author_Institution

Dept. of Phys. & Astron., California State Univ., Long Beach, CA, USA

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

2611

Lastpage

2613

Abstract

We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.

Keywords

high-temperature superconductors; measurement by laser beam; optical microscopy; superconducting epitaxial layers; superconducting tapes; superconducting transition temperature; 10 mm; 2 mm; 300 micron; bolometric response; epitaxial superconducting films; resistive properties; spatial distribution; spatial nonuniformity; superconducting transition temperature; variable temperature scanning laser microscopy; wider width high temperature superconducting films; Critical current density; High temperature superconductors; Laser beams; Laser transitions; Scanning electron microscopy; Superconducting films; Superconducting transition temperature; Temperature control; Temperature distribution; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.811908

Filename

1212152