DocumentCode
1240835
Title
PIV measurements on charged plumes-influence of SiO2 seeding particles on the electrical behavior
Author
Daaboul, Michel ; Louste, Christophe ; Romat, Hubert
Author_Institution
Lab. d´´Etudes Aerodynamiques (LEA), Univ. de Poitiers, Futuroscope
Volume
16
Issue
2
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
335
Lastpage
342
Abstract
It is well known that an isothermal dielectric liquid can be driven by electroconvection. It has been demonstrated that two phenomena could generate space charge in isothermal dielectric liquids and then induce a fluid movement. These two electroconvective effects are bulk conduction and ion injection. In order to improve the performance of electroconvective devices, the velocity of the flows must be recorded as accurately and precisely as possible. In this paper, the particle image velocimetry (PIV) method that was originally developed in the field of experimental fluid mechanics is adapted to electroconvective flow measurements. The choice and the size of seeding particles are discussed. The influence of the seeding particles density on the current is measured. In this work, experiments were investigated on a typical two-dimensional charged plume flow produced between a blade and a flat plate. Both negative and positive polarities are also investigated.
Keywords
convection; dielectric liquids; electrohydrodynamics; flow visualisation; particle velocity analysis; silicon compounds; 2D charged plume flow; SiO2; blade-plane geometry; bulk conduction; electroconvection; electroconvective effects; electrohydrodynamics; isothermal dielectric liquid; particle image velocimetry; seeding particles; space charge; Current measurement; Dielectric liquids; Electrohydrodynamics; Glass; Isothermal processes; Layout; Mechanical variables measurement; Particle measurements; Space charge; Spatial resolution; Blade-plane geometry, charged plume, dielectric liquid, electrohydrodynamics, particle image velocimetry;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2009.4815161
Filename
4815161
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