• DocumentCode
    1240835
  • Title

    PIV measurements on charged plumes-influence of SiO2 seeding particles on the electrical behavior

  • Author

    Daaboul, Michel ; Louste, Christophe ; Romat, Hubert

  • Author_Institution
    Lab. d´´Etudes Aerodynamiques (LEA), Univ. de Poitiers, Futuroscope
  • Volume
    16
  • Issue
    2
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    335
  • Lastpage
    342
  • Abstract
    It is well known that an isothermal dielectric liquid can be driven by electroconvection. It has been demonstrated that two phenomena could generate space charge in isothermal dielectric liquids and then induce a fluid movement. These two electroconvective effects are bulk conduction and ion injection. In order to improve the performance of electroconvective devices, the velocity of the flows must be recorded as accurately and precisely as possible. In this paper, the particle image velocimetry (PIV) method that was originally developed in the field of experimental fluid mechanics is adapted to electroconvective flow measurements. The choice and the size of seeding particles are discussed. The influence of the seeding particles density on the current is measured. In this work, experiments were investigated on a typical two-dimensional charged plume flow produced between a blade and a flat plate. Both negative and positive polarities are also investigated.
  • Keywords
    convection; dielectric liquids; electrohydrodynamics; flow visualisation; particle velocity analysis; silicon compounds; 2D charged plume flow; SiO2; blade-plane geometry; bulk conduction; electroconvection; electroconvective effects; electrohydrodynamics; isothermal dielectric liquid; particle image velocimetry; seeding particles; space charge; Current measurement; Dielectric liquids; Electrohydrodynamics; Glass; Isothermal processes; Layout; Mechanical variables measurement; Particle measurements; Space charge; Spatial resolution; Blade-plane geometry, charged plume, dielectric liquid, electrohydrodynamics, particle image velocimetry;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2009.4815161
  • Filename
    4815161