Title :
Texture development of MgO buffer layers grown by inclined substrate deposition
Author :
Koritala, Rachel E. ; Ma, Beihai ; Miller, Dean J. ; Li, Meiya ; Fisher, Brandon L. ; Balachandran, U.
Author_Institution :
Energy Technol. Div., Argonne Nat. Lab., IL, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
Biaxially textured magnesium oxide (MgO) films used as template layers for YBa2Cu3O7-x (YBCO)-coated conductors have been grown efficiently and consistently by inclined substrate deposition (ISD). Further improvement in texture and a decrease in surface roughness were obtained by depositing a homoepitaxial MgO layer on the ISD MgO layer at an elevated temperature and flat angle. The texture of the ISD layer was studied as a function of thickness by X-ray diffraction and scanning and transmission electron microscopy. Surface roughness of the ISD and homoepitaxial layers was investigated by atomic force microscopy. Based on the results, the optimal thickness of the ISD layer was determined.
Keywords :
X-ray diffraction; atomic force microscopy; barium compounds; electron beam deposition; epitaxial layers; high-temperature superconductors; magnesium compounds; scanning electron microscopy; substrates; superconducting thin films; surface topography; texture; transmission electron microscopy; yttrium compounds; MgO; MgO buffer layers; X-ray diffraction; YBa2Cu3O7-x; YBa2Cu3O7-x coated conductors; atomic force microscopy; biaxially textured magnesium oxide films; electron beam evaporation; elevated temperature; flat angle; homoepitaxial MgO layer; inclined substrate deposition; optimal layer thickness; scanning electron microscopy; surface roughness; template layers; texture development; transmission electron microscopy; Atomic force microscopy; Buffer layers; Conductive films; Electrons; Magnesium oxide; Rough surfaces; Surface roughness; Surface texture; Temperature; X-ray diffraction;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.811958
