Growth by MOMBE of c-axis superconducting YBCO thin films on different substrates: in situ RHEED monitoring of the growth

Author

Endo, K. ; Badica, P. ; Moriyasu, Y. ; Abe, K.

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Japan

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

2792

Lastpage

2794

Abstract

Superconducting YBCO c-axis oriented thin films have been grown by MOMBE (metalorganic molecular-beam-epitaxy). Growth of the films on different substrates [100] (Y,Nd)AlO₃, [100] SrTiO₃ and [100] MgO has been investigated by in situ monitoring the reflection high energy electron diffraction (RHEED). The paper discusses our results suggesting significant differences in films growth on the three presented substrates. The highest quality (high uniformity, epitaxy and low roughness) has been attained for the films prepared on SrTiO₃. All films, regardless substrates, have shown values between 81 and 84 K for zero resistance critical temperature T_c0.

Keywords

MOCVD coatings; barium compounds; high-temperature superconductors; molecular beam epitaxial growth; reflection high energy electron diffraction; superconducting epitaxial layers; superconducting transition temperature; yttrium compounds; (YNd)AlO₃; 81 to 84 K; MOMBE; MgO; RHEED; SrTiO₃; YBa₂Cu₃O₇; [100] (Y,Nd)AlO₃; [100] MgO; [100] SrTiO₃; c-axis superconducting YBCO thin films; epitaxy; high temperature superconductor; high uniformity; low roughness; metalorganic molecular-beam-epitaxy; reflection high energy electron diffraction; zero resistance critical temperature; Electrons; Molecular beam epitaxial growth; Monitoring; Optical films; Reflection; Substrates; Superconducting epitaxial layers; Superconducting films; Superconducting thin films; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.812014

Filename

1212201