• DocumentCode
    1241253
  • Title

    SNAP: Fault Tolerant Event Location Estimation in Sensor Networks Using Binary Data

  • Author

    Michaelides, Michalis P. ; Panayiotou, Christos G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Cyprus, Nicosia, Cyprus
  • Volume
    58
  • Issue
    9
  • fYear
    2009
  • Firstpage
    1185
  • Lastpage
    1197
  • Abstract
    This paper investigates the use of wireless sensor networks for estimating the location of an event that emits a signal that propagates over a large region. In this context, we assume that the sensors make binary observations and report the event (positive observations) if the measured signal at their location is above a threshold; otherwise, they remain silent (negative observations). Based on the sensor binary beliefs, a likelihood matrix is constructed whose maximum value points to the event location. The main contribution of this work is Subtract on Negative Add on Positive (SNAP), an estimation algorithm that provides an efficient way of constructing the likelihood matrix by simply adding pm 1 contributions from the sensor nodes depending on their alarm state (positive or negative). This simple estimation procedure provides very accurate results and turns out to be fault tolerant even when a large percentage of the sensor nodes report erroneous observations.
  • Keywords
    estimation theory; fault tolerance; matrix algebra; maximum likelihood estimation; signal processing; wireless sensor networks; SNAP; binary data; estimation algorithm; fault tolerant event location estimation; likelihood matrix; sensor binary beliefs; subtract on negative add on positive; wireless sensor networks; Estimation; Fault tolerance; Fault tolerant systems; Maximum likelihood estimation; Noise; Probability density function; Wireless sensor networks; Wireless sensor networks; binary data; event localization; fault tolerance.; maximum likelihood estimation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2009.60
  • Filename
    4815217