Title :
Chemically synthesized FePt nanoparticle material for ultrahigh-density recording
Author :
Kodama, Hiroyoshi ; Momose, Satoru ; Sugimoto, Toshio ; Uzumaki, Takuya ; Tanaka, Atsushi
Author_Institution :
Fujitsu Labs. Ltd., Kanagawa, Japan
Abstract :
We have examined the magnetic anisotropy of the "heat-treated FePt nanoparticles" annealed in a magnetic field. The magnetic easy axis of the "heat-treated FePt nanoparticles" is found to be three-dimensional (3-D) random and a partial ordering fct structure is observed before annealing in the presence of a magnetic field. The value of Mr/Ms obtained is 0.5. After annealing in the presence of a magnetic field, the M-H loop indicates that the easy axis is oriented preferably in the perpendicular direction than along the in-plane direction. The value of Hc(//)/Hc(⊥) at 10 K is 0.62 (1410 Oe/2250 Oe). The value of Mr/Ms(⊥) is 0.58 at 10 K larger than the value of Mr/Ms(//). Therefore, a weak magnetic easy axis orientation is fundamentally possible on the chemically synthesized FePt nanoparticles. We have studied the recording characteristics of a 3-D random nanoparticle medium using a GUZIK spinstand and observed the recorded patterns for the medium by imaging with a magnetic force microscopy.
Keywords :
ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic annealing; magnetic force microscopy; magnetic recording; nanoparticles; platinum alloys; 3D random nanoparticle medium; FePt; GUZIK spinstand; M-H loops; chemically synthesized FePt nanoparticle material; easy axis; heat-treated FePt nanoparticles; magnetic anisotropy; magnetic field; magnetic force microscopy; recording characteristics; surface reduction; ultrahigh-density recording; Annealing; Chemicals; Magnetic anisotropy; Magnetic fields; Magnetic materials; Magnetic recording; Nanoparticles; Nanostructured materials; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Easy axis; heat-treated FePt nanoparticles; magnetic field; surface reduction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.838050