Title :
Irradiation of LWIR detectors with X-rays generated near the sample
Author :
Flesner, L.D. ; O´Brien, M.E. ; Rogers, C.G. ; Moore, T.G.
Author_Institution :
US Naval Ocean Syst. Center, San Diego, CA, USA
fDate :
12/1/1989 12:00:00 AM
Abstract :
A novel approach for testing the effects of ionizing radiation on long-wavelength infrared (LWIR) detectors operating in a thermally shielded environment is described. An electron beam is introduced into a cryogenic chamber and used to generate low-energy X-rays in a cold target foil proximate to the detector. Applications of the method include studies of ionization-induced noise and accumulated dose. The advantages of the approach include economy of apparatus, very high potential dose rates, ease of modulation, and safety of operation
Keywords :
X-ray effects; electron device noise; infrared detectors; semiconductor device testing; LWIR detector irradiation; X-ray irradiation; accumulated dose; cold target foil; cryogenic chamber; ionising radiation effect testing; ionization-induced noise; long wavelength infrared detector; near-surface X-ray generation; operation safety; thermally shielded environment; Cryogenics; Electron beams; Infrared detectors; Ionizing radiation; Radiation detectors; Safety; Testing; Working environment noise; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
