Title :
Overdrive in the ramp histogram test of ADCs
Author :
Alegria, Francisco André Corrêa ; Serra, António Manuel da Cruz
Author_Institution :
Inst. Superior Tecnico, Univ. Tecnica de Lisboa, Lisbon, Portugal
Abstract :
This paper presents a study about the amount of overdrive to use when analog-to-digital converters (ADCs) are tested with the ramp histogram method. Overdrive is used to limit the error induced by input-equivalent noise in the estimation of the ADC transition voltages. This study has direct application in the new coarse ramp static test.
Keywords :
analogue-digital conversion; circuit testing; analog-to-digital converters; overdrive; ramp histogram test; Additive noise; Analog-digital conversion; Histograms; Linearity; Probability distribution; Sampling methods; Signal generators; Signal processing; Testing; Voltage; Analog-to-digital converter (ADC); histogram method; noise; nonlinearity; overdrive; ramp; test;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.858549
