• DocumentCode
    1242002
  • Title

    Overdrive in the ramp histogram test of ADCs

  • Author

    Alegria, Francisco André Corrêa ; Serra, António Manuel da Cruz

  • Author_Institution
    Inst. Superior Tecnico, Univ. Tecnica de Lisboa, Lisbon, Portugal
  • Volume
    54
  • Issue
    6
  • fYear
    2005
  • Firstpage
    2305
  • Lastpage
    2309
  • Abstract
    This paper presents a study about the amount of overdrive to use when analog-to-digital converters (ADCs) are tested with the ramp histogram method. Overdrive is used to limit the error induced by input-equivalent noise in the estimation of the ADC transition voltages. This study has direct application in the new coarse ramp static test.
  • Keywords
    analogue-digital conversion; circuit testing; analog-to-digital converters; overdrive; ramp histogram test; Additive noise; Analog-digital conversion; Histograms; Linearity; Probability distribution; Sampling methods; Signal generators; Signal processing; Testing; Voltage; Analog-to-digital converter (ADC); histogram method; noise; nonlinearity; overdrive; ramp; test;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2005.858549
  • Filename
    1542530
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1242002