DocumentCode :
1242011
Title :
Relationship between physical parameters and electrical parameters for recordable disk
Author :
Yue, Hongda ; Windeln, Wilbert
Author_Institution :
STEAG ETA-Optik GmbH, Heinsberg, Germany
Volume :
41
Issue :
2
fYear :
2005
Firstpage :
1009
Lastpage :
1011
Abstract :
The key to control the disk process and quality is to find the relationship between process parameters and the disk electrical capabilities. This is done in two steps: the first step is from process parameters to physical parameters, and the second step is from physical parameters to electrical parameters. While the first step is based on test experiments and process analysis, the second step is based on simulation, which is introduced in this paper.
Keywords :
optical disc storage; disk electrical capabilities; disk process; disk quality; electrical parameters; physical parameters; quality control; recordable disk; simulation model; Analytical models; Coatings; Diffraction; Electric variables measurement; Laser theory; Optical recording; Process control; Production; Sputtering; Testing; Electrical parameters; physical parameters; quality control; recordable disk; simulation model;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2004.842052
Filename :
1396284
Link To Document :
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