Title :
A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part I: forward model
Author :
Hughes, Dana ; Zoughi, Reza
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Missouri-Rolla, Rolla, MO, USA
Abstract :
The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded is presented. This formulation is based upon calculating the near-field coupling between the waveguide and the dipole as a mutual impedance.
Keywords :
dielectric materials; dielectric measurement; dielectric properties; electromagnetic wave reflection; electromagnetic wave scattering; microwave measurement; nondestructive testing; PIN diode-loaded dipole; dielectric half-space; dielectric material characterization; dielectric material property; embedded modulated scattering; embedded sensor; forward formulation; modulated scattering technique probe; near-field coupling; near-field microwave nondestructive testing; reflection coefficient; waveguide aperture; Apertures; Dielectric materials; Diodes; Impedance; Microwave theory and techniques; Mutual coupling; Nondestructive testing; Probes; Reflection; Scattering; Dielectric material characterization; embedded sensors; microwave nondestructive testing; modulated scattering technique;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.858132
