DocumentCode :
1242091
Title :
A unified approach for modeling longitudinal and failure time data, with application in medical monitoring
Author :
Berzuini, Carlo ; Larizza, Cristiana
Author_Institution :
Dipartimento di Inf. e Sistemistica, Pavia Univ., Italy
Volume :
18
Issue :
2
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
109
Lastpage :
123
Abstract :
This paper considers biomedical problems in which a sample of subjects, for example clinical patients, is monitored through time for purposes of individual prediction. Emphasis is on situations in which the monitoring generates data both in the form of a time series and in the form of events (development of a disease, death, etc.) observed on each subject over specified intervals of time. A Bayesian approach to the combined modeling of both types of data for purposes of prediction is presented. The proposed method merges ideas of Bayesian hierarchical modeling, nonparametric smoothing of time series data, survival analysis, and forecasting into a unified framework. Emphasis is on flexible modeling of the time series data based on stochastic process theory. The use of Markov chain Monte Carlo simulation to calculate the predictions of interest is discussed. Conditional independence graphs are used throughout for a clear presentation of the models. An application in the monitoring of transplant patients is presented
Keywords :
Bayes methods; Gaussian distribution; Markov processes; Monte Carlo methods; forecasting theory; nonparametric statistics; patient monitoring; time series; Bayesian approach; Bayesian hierarchical modeling; Markov chain Monte Carlo simulation; biomedical problems; clinical patients; conditional independence graphs; failure time data; flexible modeling; longitudinal data; medical monitoring; nonparametric smoothing; stochastic process theory; survival analysis; time series; transplant patients; Bayesian methods; Biomedical monitoring; Condition monitoring; Data analysis; Diseases; Patient monitoring; Predictive models; Smoothing methods; Stochastic processes; Time series analysis;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.481537
Filename :
481537
Link To Document :
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