DocumentCode :
1242192
Title :
Application of time-frequency domain reflectometry for detection and localization of a fault on a coaxial cable
Author :
Shin, Yong-June ; Powers, Edward J. ; Choe, Tok-Son ; Hong, Chan-Young ; Song, Eun-Seok ; Yook, Jong-Gwan ; Park, Jin Bae
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
Volume :
54
Issue :
6
fYear :
2005
Firstpage :
2493
Lastpage :
2500
Abstract :
In this paper, we introduce a new high-resolution reflectometry technique that operates simultaneously in both the time and frequency domains. The approach rests upon time-frequency signal analysis and utilizes a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a swept sinewave covering a frequency band of interest. This latter capability is of particular interest when testing communication cables and systems. Sensitivity in detecting the reflected signal is provided by a time-frequency cross-correlation function. The approach is verified by experimentally locating various types of faults, located at various distances, in RG 142 and RG 400 coaxial cables.
Keywords :
cable testing; coaxial cables; fault location; time-domain reflectometry; time-frequency analysis; Gaussian time envelope; chirp signal; coaxial cable; communication cable; fault detection; fault localization; frequency domain; high-resolution reflectometry; time domain; time localization; time-frequency cross-correlation function; time-frequency domain reflectometry; time-frequency signal analysis; Chirp; Coaxial cables; Communication cables; Fault detection; Frequency domain analysis; Reflectometry; Roentgenium; Signal analysis; System testing; Time frequency analysis; Chirp signal; fault detection; fault location; resolution; time-frequency cross-correlation function; time-frequency domain reflectometry (TFDR);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.858115
Filename :
1542557
Link To Document :
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