• DocumentCode
    1242259
  • Title

    Boundary Immittance Operators for the SchrÖdinger–Maxwell Problem of Carrier Dynamics in Nanodevices

  • Author

    Pierantoni, Luca ; Mencarelli, Davide ; Rozzi, Tullio

  • Author_Institution
    Dipt. di Ing. Biomedica, Univ. Politec. delle Marche, Ancona
  • Volume
    57
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1147
  • Lastpage
    1155
  • Abstract
    We have recently introduced a novel algorithm in which Maxwell equations, discretized by the transmission line matrix method, are coupled to the Schrodinger equation and simultaneously solved. The goal of this study is to develop a method that accounts for deterministic electromagnetic field dynamics together with the quantum coherent transport in the nanoscale environment. We present exact boundary conditions for the Schrodinger equation that rigorously model absorption and injection of charge at the terminal planes. As a nontrivial application of the above concept, we show the dynamics of a charge wavepacket from source to drain electrodes in a carbon nanotube transistor environment. We then compare computed characteristics with experimental ones reported in the literature.
  • Keywords
    Maxwell equations; Schrodinger equation; carbon nanotubes; charge injection; electric immittance; elemental semiconductors; field effect transistors; nanotube devices; semiconductor device models; C; CNT field-effect transistors; Schrodinger equation; Schrodinger-Maxwell problem; boundary immittance operators; carbon nanotube transistor; carrier dynamics; charge absorption model; charge injection; charge wavepacket; deterministic electromagnetic field dynamics; drain electrode; nanodevices; quantum coherent transport; source electrode; transmission line matrix method; Carbon nanotube (CNT); SchrÖdinger equation; electromagnetic (EM) theory; transmission line matrix (TLM);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2009.2017351
  • Filename
    4815403