Title :
Amplitude-modulation detection in single-stage negative-feedback amplifiers due to interfering out-of-band signals
Author :
Van der Horst, Marcel J. ; Linnenbank, André C. ; Van Staveren, Arie
Author_Institution :
Med. Tech. Dev. Dept., Univ. of Amsterdam, Netherlands
Abstract :
The electromagnetic-interference effects of out-of-band signals on negative-feedback amplifiers are investigated. It is assumed that the interfering signals picked up at the input of the amplifier are dominant. Due to the nonlinear behavior of the active devices in the amplifier, unwanted dc shifts and amplitude-modulation (AM) detection may occur. Describing these effects is usually done by using the Volterra series. Although providing good results when used for analysis, methods to use the Volterra series for the design process are not yet mature enough. A simple procedure for calculating AM detection is presented. An equivalent source at the input of the amplifier is introduced that accounts for the nonlinear effects. Because the characteristics of this source are computed as a function of design parameters, this procedure facilitates a synthesis approach for designing amplifiers with a lower susceptibility to AM detection. It is shown that the root locus of the amplifier transfer function has a large influence on the amount of AM detection and, therefore, on the electromagnetic compatibility. Measurements made on a single-stage negative-feedback amplifier support the presented procedure.
Keywords :
amplitude modulation; demodulation; electromagnetic compatibility; electromagnetic interference; feedback amplifiers; transfer functions; Volterra series; amplifier transfer function; amplitude-modulation detection; dc shift; electromagnetic compatibility; electromagnetic-interference; interfering out-of-band signal; single-stage negative-feedback amplifier; Associate members; Bandwidth; Biomedical equipment; Biomedical imaging; Degradation; Design methodology; Electromagnetic interference; Frequency; Process design; Transfer functions;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2004.842116