Title :
Microwave surface impedance and nonlinear properties of MgB2 films
Author :
Booth, James C. ; Sang Young Lee ; Leong, K.T. ; Lee, J.H. ; Lim, J. ; Lee, H.N. ; Moon, S.H. ; Oh, B.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
We have measured the temperature dependence of the microwave surface impedance and the nonlinear response of high-quality MgB2 films on c-cut sapphire at temperatures below 40 K. MgB2 films with surface resistance (Rs) as low as 0.02 mΩ at 8 K and 8.5 GHz were prepared in an ex-situ process by annealing a boron layer in magnesium-rich environment. The nonlinear properties of the MgB2 films were investigated as a function of temperature by means of higher-order harmonic-generation measurements in patterned coplanar waveguide devices. We find that the nonlinear responses of devices fabricated from MgB2 films were substantially higher than the nonlinear responses of similar devices fabricated from YBa2Cu3O7-δ thin films at the same reduced temperature. We also compared the nonlinear responses of surface ion-milled MgB2 films with as-grown films and found that the ion-milled films gave lower nonlinear responses at temperatures below 24 K. The consequences of these measurements for passive microwave device applications of MgB2 films are also discussed.
Keywords :
annealing; high-frequency effects; magnesium compounds; optical harmonic generation; superconducting microwave devices; superconducting thin films; surface impedance; type II superconductors; 0.02 mohm; 24 K; 40 K; 8 K; 8.5 GHz; MgB2; MgB2 films; annealing; higher-order harmonic-generation measurements; microwave surface impedance; nonlinear properties; nonlinear response; passive microwave device applications; patterned coplanar waveguide devices; surface ion-milled films; temperature dependence; Annealing; Boron; Coplanar waveguides; Electrical resistance measurement; Impedance measurement; Microwave measurements; Surface impedance; Surface resistance; Temperature dependence; Temperature measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.812405