• DocumentCode
    1242668
  • Title

    Study of the Excitation Power Dependent Internal Quantum Efficiency in InGaN/GaN LEDs Grown on Patterned Sapphire Substrate

  • Author

    Lee, Ya-Ju ; Chiu, Ching-Hua ; Ke, Chih Chun ; Lin, Po Chun ; Lu, Tien-Chang ; Kuo, Hao-Chung ; Wang, Shing-Chung

  • Author_Institution
    Inst. of Electro-Opt. Sci. & Technol., Nat. Taiwan Normal Univ., Taipei, Taiwan
  • Volume
    15
  • Issue
    4
  • fYear
    2009
  • Firstpage
    1137
  • Lastpage
    1143
  • Abstract
    The mechanisms of the excitation power dependent internal quantum efficiency in InGaN/GaN multiple quantum wells (MQWs) LEDs grown on the planar and the patterned sapphire substrates (PSS) at temperature of 15 and 300 K were investigated. From observation the tendency of emission peak energy and carrier lifetime variation in MQWs with different excitation power for both LED samples, we conclude the internal quantum efficiency would increase as coulomb screening effect dominates at lower carrier injection stage and decrease due to the band-filling effect at higher density stage. At room temperature, the majority of the initial injected carriers would be first consumed by the thermal activated nonradiative centers that hinder the further achievement of high-efficiency LED devices. Experimentally, the internal quantum efficiency of the LED grown on the PSS is ~70% and that of the LED grown on the planar sapphire substrate is ~62%. For the LED grown on the PSS, the observed higher internal quantum efficiency is due to the larger activation energy Therefore, the reduction of dislocation defects and the prevention of injected carriers escaping from extended states would be a promising prospective for InGaN/GaN MQWs LEDs to achieve high internal quantum efficiency.
  • Keywords
    III-V semiconductors; carrier lifetime; dislocations; gallium compounds; indium compounds; light emitting diodes; quantum well devices; semiconductor quantum wells; wide band gap semiconductors; Al2O3; InGaN-GaN; LED; activation energy; band-filling effect; carrier injection; carrier lifetime; coulomb screening; dislocation defects; emission peak energy; excitation power; internal quantum efficiency; multiple quantum wells; nonradiative centers; patterned sapphire substrates; planar sapphire substrates; room temperature; temperature 15 K; temperature 293 K to 298 K; temperature 300 K; thermal activation; GaN; Internal quantum efficiency; LEDs;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2009.2014967
  • Filename
    4815458