Title :
Optical Reflectivity of Asymmetric Dielectric–Metal–Dielectric Planar Structures
Author :
Frisbie, Stephen P. ; Krishnan, Ananth ; Xu, Xiaoyan ; de Peralta, Luis Grave ; Nikishin, Sergey A. ; Holtz, Mark W. ; Bernussi, Ayrton A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
Abstract :
We report simulations and experimental results on the incidence-angle dependence of the optical reflectivity of asymmetric dielectric-metal-dielectric planar structures. Transfer-matrix method and 2-D finite-element analysis revealed the presence of multiple resonances that were attributed to the surface plasmon (SP) polariton mode at the metal-dielectric interfaces and guided-wave polariton modes within the asymmetric dielectric-metal-dielectric waveguide. The number of guided-wave polariton resonances scale with the thickness of the dielectric guiding layer while the SP resonance remained essentially unaltered. These findings were validated through reflectivity measurements on sapphire-metal-polymer structures.
Keywords :
finite element analysis; metal-insulator boundaries; metals; optical multilayers; optical waveguides; polaritons; polymers; reflectivity; sapphire; surface plasmon resonance; 2-D finite-element analysis; asymmetric dielectric-metal-dielectric planar; asymmetric dielectric-metal-dielectric waveguide; dielectric guiding layer; guided-wave polariton modes; metal-dielectric interfaces; multiple resonances; optical reflectivity; sapphire-metal-polymer structures; surface plasmon polariton; transfer-matrix method; Metal–insulator structures; optical waveguides; plasmon;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.2009886