DocumentCode :
1243082
Title :
Reliability concerns come to the designer
Author :
Abercrombie, David ; Chow, Karen ; Basel, Mark
Volume :
3
Issue :
5
fYear :
2005
Firstpage :
16
Lastpage :
21
fLanguage :
English
Journal_Title :
Electronics Systems and Software
Publisher :
iet
ISSN :
1479-8336
Type :
jour
Filename :
1545714
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1243082
