• DocumentCode
    1243635
  • Title

    Femtosecond ultraviolet laser pulse induced lightning discharges in gases

  • Author

    Zhao, Xin Miao ; Diels, Jean-Claude ; Wang, Cai Yi ; Elizondo, Juan M.

  • Author_Institution
    Dept. of Phys. & Astron., New Mexico Univ., Albuquerque, NM, USA
  • Volume
    31
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    599
  • Lastpage
    612
  • Abstract
    Ultraviolet pulses of 200 fs duration and low energy (≈0.2 mJ) have a sufficiently high peak power to ionize oxygen and nitrogen by three- and four-photon ionization, respectively. It is shown that the resultant ionization channel induces a lightning like discharge at half of the natural self-breakdown voltage in nitrogen or air. The laser triggered discharging process is studied by monitoring the voltage between two planar electrodes. The effects of oxygen on the induced breakdown is investigated. A complete theoretical model is presented to simulate: (1) the electron seeding; and (2) the evolution of the plasma of electron-ion in the applied field. The results of the theory verified by small scale experiments-are used to simulate the process of laser triggered lightning in atmosphere, and helps to define the parameters of a laser system for lightning protection
  • Keywords
    discharges (electric); electrodes; high-speed optical techniques; laser beam effects; lightning; lightning protection; photoionisation; 0.2 mJ; 200 fs; applied field; atmosphere; electron seeding; electron-ion; femtosecond ultraviolet laser pulse; four-photon ionization; gases; high peak power; induced lightning discharges; ionization channel; ionize oxygen; laser triggered discharging process; laser triggered lightning; lightning like discharge; low energy; natural self-breakdown voltage; nitrogen; planar electrodes; plasma; small scale experiments; three-photon ionization; ultraviolet pulses; Atmospheric modeling; Ionization; Laser modes; Laser theory; Lightning; Monitoring; Nitrogen; Optical pulses; Plasma simulation; Voltage;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.364418
  • Filename
    364418