DocumentCode :
1243688
Title :
A programmable analog cellular neural network CMOS chip for high speed image processing
Author :
Kinget, Peter ; Steyaert, Michel S J
Author_Institution :
ESAT-MICAS, Katholieke Univ., Leuven, Belgium
Volume :
30
Issue :
3
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
235
Lastpage :
243
Abstract :
A high speed analog image processor chip is presented. It is based on the cellular neural network architecture. The implementation of an analog programmable CNN-chip in a standard CMOS technology is discussed. The control parameters or templates in all cells are under direct user control and are tunable over a continuous value range from 1/4 to 4. This tuning property is implemented with a compact current scaling circuit based on MOS transistors operating in the linear region. A 4×4 CNN prototype system has been designed in a 2.4 μm CMOS technology and successfully tested. The cell density is 380 cells/cm2 and the cell time constant is 10 μs. The current drain for a typical template is 40 μA/cell. The real-time image processing capabilities of the system are demonstrated. From this prototype it is estimated that a 128×128 fully programmable analog image processing system can be integrated on a single chip using a standard digital submicron CMOS technology. This work demonstrates that powerful high speed programmable analog processing systems can be built using standard CMOS technologies
Keywords :
CMOS analogue integrated circuits; VLSI; analogue processing circuits; cellular neural nets; circuit tuning; image processing; image processing equipment; real-time systems; 2.4 micron; CMOS chip; analog cellular neural network; analog image processor chip; cellular neural network architecture; continuous value range tuning; current scaling circuit; direct user control; high speed image processing; programmable neural network; real-time image processing capabilities; CMOS process; CMOS technology; Cellular neural networks; Circuit optimization; Circuit testing; Image processing; MOSFETs; Prototypes; System testing; Tunable circuits and devices;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.364437
Filename :
364437
Link To Document :
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