• DocumentCode
    1244254
  • Title

    2005 IEEE International Electron Devices Meeting

  • Volume
    5
  • Issue
    3
  • fYear
    2005
  • Firstpage
    616
  • Lastpage
    616
  • Abstract
    Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2005.862064
  • Filename
    1545927