DocumentCode :
1244262
Title :
Young´s modulus dependence on magnetic bias field in Fe/sub 73.5/Si/sub 16.5/B/sub 6/C/sub 1/Nb/sub 3/ alloy after successive annealings
Author :
Kaczkowski, Z. ; Malkinski, L. ; Muller, Mathias
Author_Institution :
Inst. of Phys., Polish Acad. of Sci., Warsaw, Poland
Volume :
31
Issue :
1
fYear :
1995
Firstpage :
791
Lastpage :
794
Abstract :
Both as-quenched and annealed (in transverse magnetic field for 1 and 2 h in temperature range from 300 up to 500/spl deg/C) samples of the amorphous alloy of composition F/sub 73.5/Si/sub 16.5/B/sub 6/C/sub 1/Nb/sub 3/ were investigated. The aim of this work was to study the influence of the annealing time and temperature on Young´s modulus changes (/spl Delta/E effect) versus magnetic bias field after successive heat treatment up to neighborhood of the nanocrystallization temperature. Elasticity moduli were measured using resonant-antiresonant method. A considerable improvement of the piezomagnetic properties was observed by increasing the annealing temperature up to 480/spl deg/C. Maximum /spl Delta/E effect reached 0.57 after one hour annealing. Annealing at 500/spl deg/C caused sudden drop of the piezomagnetic properties, which can be explained by the decrease of the magnetostriction accompanying the appearance of the nanocrystalline phase.<>
Keywords :
Young´s modulus; amorphous magnetic materials; annealing; boron alloys; copper alloys; iron alloys; magnetostriction; metallic glasses; nanostructured materials; niobium alloys; silicon alloys; 300 to 500 degC; Fe/sub 73.5/Si/sub 16.5/B/sub 6/C/sub 1/Nb/sub 3/; Young´s modulus; amorphous alloy; annealing; elastic moduli; magnetic bias field; magnetostriction; nanocrystallization temperature; piezomagnetic properties; resonant-antiresonant method; Amorphous magnetic materials; Amorphous materials; Annealing; Iron; Magnetic fields; Magnetic resonance; Magnetostriction; Niobium alloys; Silicon alloys; Temperature distribution;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.364596
Filename :
364596
Link To Document :
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