• DocumentCode
    1244326
  • Title

    Review of the mechanisms of electrode and insulator erosion and degradation in high current arc environments

  • Author

    Engel, Thomas G. ; Wester, S.L. ; Kristiansen, M. ; Donaldson, A.L.

  • Author_Institution
    Pulsed Power Lab., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    31
  • Issue
    1
  • fYear
    1995
  • Firstpage
    709
  • Lastpage
    713
  • Abstract
    The mechanisms responsible for the erosion and degradation of electrode and insulator materials in high current arc discharge environments such as electromagnetic launchers are reviewed. The review represents the experimental results obtained from several studies and are from investigations into materials performance in high current closing switches such as spark gaps and surface discharge switches. Parameters of interest that affect electrode and insulator material erosion and degradation include peak current, charge transfer, mass erosion, the surface voltage holdoff recovery, and arc velocity. Other parameters that have been shown to affect materials performance include the synergistics produced by certain electrodes, insulators, and gas combinations. Models that describe the erosion and degradation processes are presented and compared to the experimental results.<>
  • Keywords
    arcs (electric); electrodes; electromagnetic launchers; insulators; pulsed power switches; spark gaps; surface discharges; wear; arc velocity; charge transfer; degradation; electrode; electromagnetic launchers; erosion; high current arc environments; high current closing switches; insulator; mass erosion; materials performance; peak current; spark gaps; surface discharge switches; surface voltage holdoff recovery; Arc discharges; Charge transfer; Degradation; Electrodes; Electromagnetic launching; Insulation; Spark gaps; Surface discharges; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.364606
  • Filename
    364606