Capacitive coupling noise in high-speed VLSI circuits

Author

Heydari, Payam ; Pedram, Massoud

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA

Volume

24

Issue

3

fYear

2005

fDate

3/1/2005 12:00:00 AM

Firstpage

478

Lastpage

488

Abstract

Rapid technology scaling along with the continuous increase in the operation frequency cause the crosstalk noise to become a major source of performance degradation in high-speed integrated circuits. This paper presents an efficient metric to estimate the capacitive crosstalk in nanometer high-speed very large scale integration circuits. In particular, we provide closed-form expressions for the peak amplitude, the pulsewidth, and the time-domain waveform of the crosstalk noise. Experimental results show that the maximum error of our noise predictions is less than 13%, while the average error is only 5.82%.

Keywords

CMOS integrated circuits; VLSI; capacitance; coupled circuits; high-speed integrated circuits; integrated circuit noise; nanoelectronics; time-domain analysis; waveform analysis; CMOS circuits; capacitance; capacitive coupling noise; capacitive crosstalk estimation; closed-form expressions; crosstalk noise; deep submicron; high-speed VLSI circuits; nanometer high-speed integrated circuits; peak amplitude; pulsewidth; time-domain waveform; very large scale integration circuits; Circuit noise; Closed-form solution; Coupling circuits; Crosstalk; Degradation; Frequency; High speed integrated circuits; Integrated circuit noise; Integrated circuit technology; Very large scale integration; CMOS circuits; Capacitance; crosstalk; deep submicron; interconnect; noise; very large scale integration (VLSI);

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2004.842798

Filename

1397807