• DocumentCode
    1244631
  • Title

    Highly linear Al/sub 0.3/Ga/sub 0.7/N-Al/sub 0.05/Ga/sub 0.95/N-GaN composite-channel HEMTs

  • Author

    Jie Liu ; Yugang Zhou ; Rongming Chu ; Yong Cai ; Chen, K.J. ; Lau, K.M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • Volume
    26
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    145
  • Lastpage
    147
  • Abstract
    We report an Al/sub 0.3/Ga/sub 0.7/N-Al/sub 0.05/Ga/sub 0.95/N-GaN composite-channel HEMT with enhanced linearity. By engineering the channel region, i.e., inserting a 6-nm-thick AlGaN layer with 5% Al composition in the channel region, a composite-channel HEMT was demonstrated. Transconductance and cutoff frequencies of a 1 ×100 μm HEMT are kept near their peak values throughout the low- and high-current operating levels, a desirable feature for linear power amplifiers. The composite-channel HEMT exhibits a peak transconductance of 150 mS/mm, a peak current gain cutoff frequency (fT) of 12 GHz and a peak power gain cutoff frequency (fmax) of 30 GHz. For devices grown on sapphire substrate, maximum power density of 3.38 W/mm, power-added efficiency of 45% are obtained at 2 GHz. The output third-order intercept point (OIP3) is 33.2 dBm from two-tone measurement at 2 GHz.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; 12 GHz; 2 GHz; AlGaN-GaN; channel engineering; channel region; composite channel; cutoff frequencies; high electron mobility transistors; linear power amplifiers; sapphire substrate; transconductance; Aluminum gallium nitride; Cutoff frequency; Gallium nitride; HEMTs; High power amplifiers; Linearity; MODFETs; Multiaccess communication; Radiofrequency amplifiers; Transconductance; AlGaN–GaN; channel engineering; composite channel; high-electron mobility transistors (HEMTs); linearity;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2005.843218
  • Filename
    1397841