• DocumentCode
    1244759
  • Title

    630-nm n-type Modulation-doped AlGaInP-AlInP multiquantum-well light-emitting diode

  • Author

    Lee, Chong-Yi ; Su, Juh-Yuh ; Kuo, Chi-Min

  • Author_Institution
    Dept. of Electron. Eng., I-Shou Univ., Taiwan, Taiwan
  • Volume
    18
  • Issue
    1
  • fYear
    2006
  • Firstpage
    25
  • Lastpage
    27
  • Abstract
    AlGaInP-AlInP multiple quantum-well (MQW) light-emitting diodes (LEDs) with n-type modulation-doped (MD) structure were grown by metal-organic vapor-phase epitaxy. Their characteristics were then evaluated using current-voltage (I-V), electroluminescence and output power measurements. Experimental results indicated that the LEDs exhibited a higher output power, a lower dynamic resistance, and a smaller wavelength variation than conventional LEDs. The n-type MD-MQW LEDs exhibited a higher external quantum efficiency (7.19%) and a larger maximum output power (14.84 mW) under the dc operation as compared to those of 6.73% and 12.55 mW for the conventional LEDs, respectively. This could be tentatively attributed to the better junction heating effect resulting from the n-type MD-MQW structure in which the electron thermal velocity is suppressed, especially at a high-level injection. These positive results could also be explained by the MD-MQW LED supplying a higher electron concentration than in the conventional structure.
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; electro-optical modulation; electroluminescence; indium compounds; light emitting diodes; quantum well devices; semiconductor epitaxial layers; 12.55 mW; 14.84 mW; 630 nm; AlGaInP-AlInP; AlGaInP-AlInP light-emitting diode; current-voltage electroluminescence; dc operation; dynamic resistance; electron concentration; electron thermal velocity; external quantum efficiency; high-level injection; junction heating effect; metal-organic vapor-phase epitaxy; modulation-doped light-emitting diode; multiquantum-well light-emitting diode; n-type light-emitting diode; output power measurements; Current measurement; Electrical resistance measurement; Electroluminescence; Electrons; Epitaxial growth; Epitaxial layers; Light emitting diodes; Power generation; Power measurement; Quantum well devices; AlGaInP; light-emitting diode (LED); metal-organic vapor-phase epitaxy (MOVPE); modulation-doped (MD); multiple quantum well (MQW);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2005.859995
  • Filename
    1546025