• DocumentCode
    1244787
  • Title

    Modeling of MODFETs

  • Author

    Salmer, Georges ; Zimmermann, Jacques ; Fauquembergue, Renaud

  • Author_Institution
    Univ. des Sci. et Tech. de Lille-Flandres-Artois, Villeneuve d´´Ascq, France
  • Volume
    36
  • Issue
    7
  • fYear
    1988
  • fDate
    7/1/1988 12:00:00 AM
  • Firstpage
    1124
  • Lastpage
    1140
  • Abstract
    Accurate modeling of MODFETs and of certain novel structures recently proposed requires that a number of physical phenomena occurring in these devices be considered. Among these, some electron dynamic properties of the two-dimensional gas, the influence of deep levels of the doped AlGaAs layers, and the influence of the source parasitic access impedance are reviewed. The presently available models can roughly be sorted into three classes: the particle or Monte Carlo models, the two-dimensional solving methods of semiconductor equations, and the simpler one-dimensional or analytical models. After a brief review of the physical bases on which the models rely, their main capabilities and ranges of applicability are discussed. Some conclusions are drawn as to the effort which must be developed in the near future to improve MODFET modeling. It is recommended that simulations of devices such as SISFETs, multichannel structures, and pseudomorphic AlGaAs/InGaAs transistors be undertaken
  • Keywords
    Monte Carlo methods; high electron mobility transistors; semiconductor device models; 1D models; 2D models; AlGaAs; AlGaAs-InGaAs; MODFETs; Monte Carlo models; SISFETs; analytical models; electron dynamic properties; influence of deep levels; modeling; multichannel structures; physical phenomena; pseudomorphic transistors; ranges of applicability; source parasitic access impedance; two-dimensional gas; two-dimensional solving methods; Analytical models; Electrons; Equations; FETs; Gallium arsenide; HEMTs; Heterojunctions; Impedance; Indium gallium arsenide; Integrated circuit modeling; MODFET circuits; MODFETs; Microwave devices; Monte Carlo methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3647
  • Filename
    3647