DocumentCode :
1244865
Title :
A class of exact and higher-order surface boundary conditions for layered structures
Author :
Cicchetti, Renato
Author_Institution :
Dipartimento di Ingegneria Elettronica, Rome LUniv., Italy
Volume :
44
Issue :
2
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
249
Lastpage :
259
Abstract :
A class of exact and higher-order surface impedance boundary conditions (HOIBCs) is derived. Initially, exact impedance boundary conditions (IBCs) are derived first in the spectral and then in the coordinate domain. It is shown that in the coordinate domain they are expressed by a dyadic operator acting on the convolution product between the scalar Green´s function, corresponding to the considered structure, and the tangential magnetic field. Next, it is demonstrated that the higher-order impedance boundary conditions in the spatial domain correspond to an appropriate expansion of the mentioned convolution product in the space domain. Finally, the accuracy of the HOIBCs is estimated by comparing the exact solution with that obtained through the HOIBCs for some typical canonical problems. The corresponding error curves presented refer to the worst error situation for each one of the chosen cases
Keywords :
Green´s function methods; boundary-value problems; convolution; electric impedance; electromagnetic wave propagation; electromagnetic wave scattering; error analysis; magnetic fields; spectral-domain analysis; EM wave scattering; canonical problems; convolution product; coordinate domain; dyadic operator; error curves; exact impedance boundary conditions; exact surface boundary conditions; higher-order surface boundary conditions; layered structures; scalar Green´s function; spectral domain; tangential magnetic field; Acoustic scattering; Boundary conditions; Convolution; Electromagnetic fields; Electromagnetic scattering; Fourier transforms; Geometry; Magnetic fields; Solid modeling; Surface impedance;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.481655
Filename :
481655
Link To Document :
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