• DocumentCode
    1244984
  • Title

    Demagnetization due to inverse magnetostriction effects in longitudinal thin film media

  • Author

    Tae Gun Jeong ; Bogy, D.B.

  • Author_Institution
    Dept. of Mech. Eng., Konkuk Univ., Seoul, South Korea
  • Volume
    31
  • Issue
    2
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    1007
  • Lastpage
    1012
  • Abstract
    Unpredictable mechanical stresses that occur during the operation of hard disk drives can degrade the recorded signal. On the basis of a micromagnetic analysis and the calculated stress field during head-disk impact, inverse magnetostriction effects in longitudinal recording thin film media are considered and demagnetization due to head-disk impact is simulated numerically. Thin film media are modeled as planar hexagonal arrays of hexagonally shaped grains. The computation uses the conjugate gradient algorithm to minimize the variation of the total energy. In particular, the effect of the stress on the relaxation process is investigated. Also the change in the remanent magnetization due to repetitive head-disk impacts is calculated. We obtained results indicating that the effect of the impact stress during dynamic loading is not so significant as to cause data loss during operation for the longitudinal thin film media.<>
  • Keywords
    conjugate gradient methods; demagnetisation; hard discs; magnetic thin film devices; magnetostriction; remanence; conjugate gradient algorithm; demagnetization; dynamic loading; hard disk drives; head-disk impact; hexagonally shaped grains; inverse magnetostriction effects; longitudinal thin film media; mechanical stresses; micromagnetic analysis; planar hexagonal arrays; recorded signal degradation; relaxation process; remanent magnetization; Computational modeling; Degradation; Demagnetization; Disk recording; Hard disks; Magnetic analysis; Magnetostriction; Micromagnetics; Stress; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.364776
  • Filename
    364776