DocumentCode :
1245090
Title :
Giant magneto-impedance in Co-rich amorphous wires and films
Author :
Panina, L.V. ; Mohri, K. ; Uchiyama, T. ; Noda, M. ; Bushida, K.
Author_Institution :
Dept. of Electr. Eng., Nagoya Univ., Japan
Volume :
31
Issue :
2
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
1249
Lastpage :
1260
Abstract :
A comprehensive analysis of magneto impedance (MI) phenomena in Co-rich amorphous materials is presented on the basis of skin effect in combination with dynamical magnetization processes. We consider a MI effect for which the domain walls are perpendicular to the current and field direction. Thus, the magnetization induced by current proceeds, via both the wall movement and moment rotation. The magnetic responses of impedance in wires and films have some common features and can be understood from the same mechanism. The sensitivity of the magnetic response in a small sample (1 mm length and a few micrometer thickness) is about 10%/Oe in wires and 5%/Oe in films. The model describes well the existing experimental data for moderate frequencies, There is some quantitative discrepancy for the case of a very strong skin effect, where the position dependence of basic magnetostatic parameters is important.<>
Keywords :
amorphous magnetic materials; boron alloys; cobalt alloys; ferromagnetic materials; giant magnetoresistance; iron alloys; magnetic domain walls; magnetic domains; magnetic moments; silicon alloys; skin effect; soft magnetic materials; CoFeSiB; amorphous films; amorphous wires; domain walls; dynamical magnetization processes; giant magneto-impedance; magnetic response; magnetostatic parameters; moment rotation; skin effect; soft magnetic materials; wall movement; Amorphous magnetic materials; Amorphous materials; Impedance; Magnetic analysis; Magnetic domain walls; Magnetic domains; Magnetic films; Magnetostatics; Skin effect; Wires;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.364815
Filename :
364815
Link To Document :
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