• DocumentCode
    12452
  • Title

    Laser Induced Magnetization Reversal for Detection in Optical Interconnects

  • Author

    Al Azim, Zubair ; Xuanyao Fong ; Ostler, Thomas ; Chantrell, Roy ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    35
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    1317
  • Lastpage
    1319
  • Abstract
    Optical interconnect has emerged as the front-runner to replace electrical interconnect especially for off-chip communication. However, a major drawback with optical interconnects is the need for photodetectors and amplifiers at the receiver, implemented usually by direct bandgap semiconductors and analog CMOS circuits, leading to large energy consumption and slow operating time. In this letter, we propose a new optical interconnect architecture that uses a magnetic tunnel junction (MTJ) at the receiver side that is switched by femtosecond laser pulses. The state of the MTJ can be sensed using simple digital CMOS latches, resulting in significant improvement in energy consumption. Moreover, magnetization in the MTJ can be switched on the picoseconds time-scale and our design can operate at a speed of 5 Gb/s for a single link.
  • Keywords
    high-speed optical techniques; laser beam effects; magnetic tunnelling; magnetisation reversal; optical interconnections; MTJ; bit rate 5 Gbit/s; digital CMOS latches; energy consumption; laser induced magnetization reversal; magnetic tunnel junction; optical interconnects; CMOS integrated circuits; CMOS technology; Ferrimagnetic materials; Magnetic tunneling; Magnetization reversal; Optical interconnections; Complementary metal-oxide-semiconductor (CMOS); Magnetic tunnel junction (MTJ); Non-equilibrium Green’s function (NEGF); Rare Earth (RE)Transition Metal (TM) ferrimagnetic materials; complementary metal-oxide-semiconductor (CMOS); non-equilibrium green???s function (NEGF); rare earth (RE)-transition metal (TM) ferrimagnetic materials;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2364232
  • Filename
    6936854